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Editing Log
. Appl. Phys. Lett. 89, 152123 (2006) , “Electrical characterization of defects introduced in n-type Ge during indium implantation”, F. D. Auret, P. J. Janse van Rensburg, M. Hayes, J. M. Nel, W. E. Meyer, S. Decoster, V. Matias, and A. Vantomme
All papers (3399)
Updated at 2010-07-20 16:50:39
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1329 untagged
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Charge(9 tags)
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Defect(antisite)(6 tags)
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Defect(interstitial)(18 tags)
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Label(303 tags)
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⚠ Our services moved from http://www.kc.tsukuba.ac.jp/div-media/... to http://esrlab.bk.tsukuba.ac.jp/div-media/... in January 2018. The functions of the our services are unchanged. Thank you.