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- 1. Appl. Phys. Lett. 89, 063503 (2006) , “Degradation mechanism of organic light-emitting device investigated by scanning photoelectron microscopy coupled with peel-off technique”, H. J. Shin, M. C. Jung, J. Chung, K. Kim, J. C. Lee, and S. P. LeeThe authors present space-resolved spectroscopic data on organic layers of a degraded organic light-emitting device. The data were obtained using a scanning photoelectron microscope (SPEM) coupled with peel-off technique to directly probe the uncontaminated organic layers, which were covered with... (Read more)
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Updated at 2010-07-20 16:50:39
Updated at 2010-07-20 16:50:39
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