Papers - tagged 'DLTS EPR 183W' - Defect dat@base
http://esrlab.jp/div-media/defect/index.php?q=&material=&method=DLTS+EPR&defect=183W&sb=u
Papers - Defect dat@base2006-03-10T18:31:22+09:00Deep level defects in sublimation-grown 6H silicon carbide investigated by DLTS and EPR
http://dx.doi.org/10.1016/S0921-4526(01)00887-0
K. Irmscher, I. Pintilie, L. Pintilie and D. Schulz, Physica B 308-310, 730 (2001) 2006-03-10T18:31:22+09:00