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- 1. Solid State Physics 13, 223-304 (1962) , Academic Press, New York (Edited by F. Seitz, D. Turnbull) , “Electron Spin Resonance in Semiconductors”, G. W. Ludwig, H. H. Woodbury.I. Introduction (p.223): II. The Resonance Technique (p.226): 1. The Spin Hamiltonian (p.226), 2. The Spin Resonance Spectrum (p.231), 3. Experimental Techniques (p.237), III. Resonance Studies in Silicon (p.243): 4. Shallow Donor Impurities (p.244), 5. Shallow Acceptor Impurities (p.259), 6. Transition Metal Ions (p.263), 7. Impurity Pairs (p.273), 8. Radiation Damage Centers (p.280), IV.Resonance Studies in Other Semiconductors (p.286): 9. Germanium (p.286), 10. Graphite and Diamond (p.290), 11. Silicon Carbide (p.293), 12. Indium Antimonide and Gallium Phosphide (p.294), 13. Zinc Sulfide and Related Semiconductors (p.295), Acknowledgments (p.304)
- 2. Phys. Rev. 126, 466 (1962) , “Spin Resonance of Pd and Pt in Silicon”, H. H. Woodbury and G. W. LudwigThe transition metals Pd and Pt usually occur in diamagnetic form. However, in silicon both Pd and Pt act as acceptor impurities; the ions Pd- and Pt- are paramagnetic and have been studied by electron spin resonance. Both ions have a [001] and two mutually perpendicular [110]... (Read more)
- 3. J. Catalysis 111, 199-209 (1988) , “Structural analysis of ZnO/ZnCr2O4/Pd catalyst”, Lucio ForniThe ZnO/ZnCr2O4/Pd mixture is an effective catalyst for the preparation of pyrazines from diamines and glycols. The effects of the method of preparation, the Zn/Cr ratio, and the concentration of Pd have been studied by analyzing the catalyst structure using several techniques. In the coprecipitated... (Read more)
- 4. Appl. Phys. Lett. 88, 242110 (2006) , “Electrical characterization of defects introduced during electron beam deposition of Pd Schottky contacts on n-type Ge”, F. D. Auret, W. E. Meyer, S. Coelho, and M. HayesWe have investigated by deep level transient spectroscopy the hole and electron trap defects introduced in n-type Ge during electron beam deposition (EBD) of Pd Schottky contacts. We have also compared the properties of these defects with those introduced in the same material during... (Read more)
- 5. Appl. Phys. Lett. 89, 202114 (2006) , “Deep level transient spectroscopy study of Pd and Pt sputtering damage in n-type germanium”, E. Simoen, K. Opsomer, C. Claeys, K. Maex, C. Detavernier, R. L. Van Meirhaeghe, and P. ClauwsDefect formation during Pd and Pt germanidation of n-type germanium, using rapid thermal annealing in the range of 300–500 °C, is investigated by deep level transient spectroscopy. Small concentrations of an electron trap at ~EC−0.385 eV are found,... (Read more)
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