Papers - tagged 'H-H 0.5-1.0eV' - Defect dat@base
http://esrlab.jp/div-media/defect/index.php?q=&material=&method=&defect=H-H+0.5-1.0eV&sb=u
Papers - Defect dat@base
2010-06-14T17:37:27+09:00
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A comprehensive model of PMOS NBTI degradation
http://dx.doi.org/10.1016/j.microrel.2004.03.019
, Microelectron. Reliability 45, 71 (2005)
2010-06-14T17:37:27+09:00
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Ab initio study of hydrogen interaction with pure and nitrogen-doped carbon nanotubes
http://dx.doi.org/10.1103/PhysRevB.75.075420
Zhiyong Zhang and Kyeongjae Cho, Phys. Rev. B 75, 075420 (2007)
2007-06-18T12:14:18+09:00