Papers - tagged '33S' - Defect dat@base
http://esrlab.jp/div-media/defect/index.php?q=&material=&method=&defect=33S&sb=u
Papers - Defect dat@base2009-11-18T18:47:15+09:00Defect Identification in Silicon Using Electron Nuclear Double Redonance
http://esrlab.jp/div-media/defect/index.php?q=&material=&method=&defect=33S&sb=u&id=1816#1816
C. A. J. Ammerlaan, M. Sprenger, R. van Kemp, D. A. van Wezep., Mater. Res. Soc. Symp. Proc. 46, 227 (1985) 2009-11-18T18:47:15+09:00Hydrogen passivation of the selenium double donor in silicon:?A study by magnetic resonance
http://dx.doi.org/10.1103/PhysRevB.61.7448
P. T. Huy, C. A. J. Ammerlaan, T. Gregorkiewicz, D. T. Don., Phys. Rev. B 61, 7448-7458 (2000) 2006-03-17T02:39:15+09:00