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- 1. Appl. Phys. Lett. 88, 141901 (2006) , “Defects in Cu2O studied by deep level transient spectroscopy”, G. K. Paul, Y. Nawa, H. Sato, T. Sakurai, and K. AkimotoHole traps in p-type Cu2O were studied by means of deep level transient spectroscopy in the heterostructure of p-Cu2O/i-ZnO/n-ZnO. In addition to the trap level at about 0.45 eV from the valance band edge, which is already reported as being due to... (Read more)
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Updated at 2010-07-20 16:50:39
Updated at 2010-07-20 16:50:39
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Materials
(111 tags)
Others(101 tags)
Technique
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Details
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Bond(35 tags)
Defect(interstitial)(18 tags)
Defect(vacancy)(15 tags)
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Element(65 tags)
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Sample(17 tags)
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