Editing Log
.
J. Appl. Phys. 100, 093507 (2006) ,
“A view of the implanted SiC damage by Rutherford backscattering spectroscopy, spectroscopic ellipsometry, and transmission electron microscopy”, G. Battistig, N. Q. Khánh, P. Petrik, T. Lohner, L. Dobos, B. Pécz, J. García López, and Y. Morilla
- last updated at 2006-12-14 15:48:18
Updated at 2010-07-20 16:50:39
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Materials
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Others(101 tags)
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Technique
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1058
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Details
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Bond(35 tags)
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Defect(interstitial)(18 tags)
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20
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5
Defect-type(19 tags)
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Element(65 tags)
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20
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1
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85
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165
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3
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234
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1
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24
Energy(8 tags)
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35
24
14
10
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Isotope(56 tags)
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40
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Label(303 tags)
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Sample(17 tags)
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160
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Spin(8 tags)
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Symmetry(15 tags)
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