Editing Log
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Appl. Phys. Lett. 88, 253504 (2006) ,
“Single silicon vacancy-oxygen complex defect and variable retention time phenomenon in dynamic random access memories”, T. Umeda, K. Okonogi, K. Ohyu, S. Tsukada, K. Hamada, S. Fujieda, and Y. Mochizuki
Si| EDMR Theory electrical-meas.| 0(neutral) 0.1-0.5eV 1.0eV~ A14 Oxygen P2 Silicon Vsi bistable/metastable complex(=3) dangling-bond device pair(=2) vacancy .inp files: Si/V2-O Si/V2-O2 | last update: Takahide Umeda
- last updated at 2006-11-06 18:54:37
- 2006-11-06 18:54:37 Takahide Umeda, University of Tsukuba, Si | EDMR Electrical_measurements Theory | 0(neutral) 0.1-0.5eV 1.0eV~ A14 Oxygen P2 Silicon bistable/metastable dangling_bond pair(=2) vacancy Vsi complex(=3) device
- 2006-10-31 12:24:14 Takahide Umeda, University of Tsukuba, Si | EDMR Electrical_measurements Theory | 0(neutral) A14 Oxygen P2 Silicon bistable/metastable dangling_bond pair(=2) vacancy 1.0eV~ 0.1-0.5eV
- 2006-06-27 12:54:44 Takahide Umeda, University of Tsukuba
Updated at 2010-07-20 16:50:39
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Materials
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Others(101 tags)
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Technique
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Details
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Bond(35 tags)
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Defect(interstitial)(18 tags)
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Defect-type(19 tags)
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Element(65 tags)
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Energy(8 tags)
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Isotope(56 tags)
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Label(303 tags)
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Sample(17 tags)
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Spin(8 tags)
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Symmetry(15 tags)
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