Editing Log
.
Phys. Rev. B 50, 14710-14713 (1994) ,
“Defect-defect hole transfer and the identity of border traps in SiO2 films”, W. L. Warren, D. M. Fleetwood, M. R. Shaneyfelt, P. S. Winokur, R. A. B. Devine
- last updated at 2006-03-29 12:51:09
Updated at 2010-07-20 16:50:39
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| 1329 | untagged |
Materials
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Others(101 tags)
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Technique
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Details
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Bond(35 tags)
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Defect(interstitial)(18 tags)
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20
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5
Defect-type(19 tags)
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37
18
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Element(65 tags)
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20
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1
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85
4
165
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234
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2
1
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24
Energy(8 tags)
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35
24
14
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Isotope(56 tags)
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40
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Label(303 tags)
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Sample(17 tags)
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65
Spin(8 tags)
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Symmetry(15 tags)
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